Electromagnetic Field Analysis (EM-FIELD 3D)
This analysis software enables electromagnetic field analysis involving magnets, electrodes, and dielectrics in a simple and fast way.
With a flow-based workflow, boundary conditions and material settings are streamlined, and meshes are automatically generated even for complex geometries.
Adaptive refinement ensures accuracy in critical areas such as electrode tips, narrow gaps, and regions where electric and magnetic fields are concentrated.
From visualization of electromagnetic field distributions and creation of cross-sectional plots to identification of maximum field intensity locations and parameter studies (condition comparison), the software provides end-to-end support and helps reduce the number of prototypes and experiments.
Electron Trajectory Analysis (PIC-ELECTRON 3D)
Electron trajectory analysis can be performed easily and quickly.
A flow-based process guides particle conditions (initial position, velocity, and emission angle) and electric field conditions step by step, while automatically generating meshes for complex geometries.
Adaptive refinement ensures accuracy in important regions such as electrode edges and narrow gaps.
The software provides end-to-end support, from trajectory visualization to analysis of physical quantities such as current density and electron velocity, helping reduce the number of prototypes and experiments.
Plasma Analysis (PIC-PLASMA 3D)
Plasma analysis can be performed easily and quickly.
A flow-based process organizes plasma conditions (gas species, pressure, temperature, and initial density) and voltage conditions step by step, while automatically generating meshes for complex geometries.
Adaptive refinement ensures accuracy in important regions such as electrode edges, narrow gaps, and sheath formation areas.
The software provides end-to-end support for analysis of physical quantities such as density, potential, electric field, magnetic field, various particle fluxes, and reaction rates, as well as 2D/3D visualization, helping reduce the number of prototypes and experiments.
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